Logo Logo
 Search  |  Site Map  |  Contact Us  |  Login  |  Home 
Quick Search  Quick Search
About Agilent  |   Products & Services  |   Industries  |   International  |   Online Stores
Home > Products & Services > Test & Measurement > Technical Support > Metrology Forum
Metrology Forum : Standards

Internal Audit: Global Program Continuity During Adverse Business Conditions

About this Article
This article by Bill Eyler was presented at the NCSL International 2002 Symposium and published in the Proceedings.

Abstract

In times of restricted expense budgets and perhaps reduced human resources, it may be opportune to introduce some new thinking and methodology in managing your internal audit programs. Customers and internal groups alike may be expecting more than your internal audit program can realistically deliver, so where to focus and what to do?

This paper is designed to introduce and discuss the global internal audit program structure and methodology utilized within the support organization of Agilent Technologies' Electronic Products and Solutions Group. The current audit program has been modified and updated to provide improved program management during very difficult business conditions. Updating strategy, more effective audit planning, developing new methods and better overall program administration are some of the modifications now built into our global audit program. The design criteria for our audit program and how many of the key issues were resolved, some of which resulted in cost savings, is included.

View or Download

The entire paper is available to view or download in Portable Document Format. But if your browser doesn't already have the (free) viewer installed, you will first need to get and install the Acrobat® Reader™.

PDF fileInternal audit program continuity during adverse business conditions

 

Explore

Articles

Basics

Contents

Download

Just for Fun

Metrology Forum Home

Metrology News & Events

Standards

Worldwide

Also in this Section
 
Download

Get Acrobat Reader

 

 
--------------------
Copyright 2000 Agilent Technologies | Terms and ConditionsPrivacy Statement