Timebase Oscillator Calibration
Counting and Clocks
Counting intervals has been going on since
man's beginning. Early time measurements involved counting the number
of days in terms of sunrises, sunsets, or moons. Later, the day
was divided into smaller increments by using an hourglass, candles,
sundial, etc. With the discovery of the pendulum, clocks were born.
The accuracy of early clocks was around 1 part in 1000.
As more accurate clocks were produced, new
uses of time measurement were explored. As new uses were discovered,
the need for even more accurate clocks became apparent.
Atomic Accuracy
Current state-of-the-art atomic frequency
standards have attained an accuracy of 1 part in 1013
(1 in 10 million, million) in the laboratory. The specified
accuracy in commercially available atomic clocks has reach ±1 x
10-12. This unprecedented commercial accuracy is equivalent
to a gain or loss of 1 second in a minimum of 400,000 years.
Definition of a Second
Frequency standards and clocks have no fundamental
differences -- they are based upon dual aspects of the same phenomenon.
The basic unit of time, the second, is defined as "the duration
of 9,192,631,770 periods of transition within the cesium atom."
Frequency is determined by counting the number of cycles over the
period of a second. Therefore, the definition of a clock can be
expressed as a device that counts the number of seconds occurring
from an arbitrary starting time.
From this definition it appears that a clock
needs three basic parts. First, a source of events to be counted.
This source can be labeled a frequency standard, frequency source,
or time interval standard. Second, a means of accumulating these
events or oscillations. Third, a means of displaying the accumulation
of time.
Errors in Accuracy
Accuracy in a timekeeping system is dependent
on six major problem areas:
- Maintenance of accurate frequency
- Accurate time transfer
- Determination of radio propagation path
delays
- Maximization of the frequency calibration
interval
- Determination of the effects of noise
in frequency generating equipment
- Determination of the effects of changing
environmental conditions
Prior to analyzing the effects and impact
of the above sources of error, it is necessary to determine the
level of accuracy required and the tolerances essential for the
individual application. Once the essential tolerances have be established,
the sources of error can be analyzed to determine if they have impact
on system operation. If, in fact, they affect the system operation,
the appropriate steps can be taken to reduce that impact.
Types of Time Base Oscillator
There are five basic types of time base
oscillators:
- XO - Room temperature crystal oscillator
(sometimes referred to as RTXO)
- TCXO - Temperature compensated crystal
oscillator
- OvenXO - Oven controlled crystal oscillator
- Rubidium
- Cesium
Each type of time base has its own characteristics.
The room temperature model would be used in a portable counter.
Usually, the better the time base, the longer it takes to verify
it; the poorer the time base, the harder it is to adjust. Some timebase
specifications would be impractical to completely verify, so operator
judgment is required to identify which parameters have to be checked,
when to adjust the time base, and when to predict final performance
based upon rate of change of measured performance.
Figure 1 -- Effect of
ageing on frequency stability
Time Base Aging
The physical properties of the quartz crystal
exhibit a gradual change with time resulting in a gradual cumulative
frequency drift called "aging." See Figure 1. The
aging rate is dependent on the inherent quality of the crystals
used, and goes on all the time. Aging is often specified in terms
of frequency changes-per-month since temperature and other effects
would mask the small amount of aging for a shorter time period.
Aging for air crystals is given in frequency changes-per-month as
it is not practical to accurately and correctly measure over any
shorter averaging period. For a good RTXO, the aging rate is typically
of the order of 3 parts per 107 per month. For a high
quality oven controlled oscillator, the aging rate is typically
1.5 parts per 108 per month.
Aging rate specifies maximum frequency change
with time. Any oscillator can be much better than specified but
will never be worse than the indicated rate unless it is malfunctioning.
You may have noticed that Agilent has two kinds of specifications
-- some oscillators are specified as having a daily aging rate,
such as <3 x 10-9/day, while others are specified
as having a monthly aging rate, such as <3 x 10-7/month.
Agilent oscillators with a daily aging rate specification use ovens
that sufficiently buffer the oscillator from the environment.
To determine crystal aging rate, one has
to check the oscillator once a day when room temperature is at a
constant value, plot these points for approximately a month, then
draw a line through the points. The slope of the line is the aging
rate of the crystal. By doing this you have created an "historical
aging rate" of your unit. This is an important concept and
each instrument should have its own history record. Table 1
summarizes the oscillator characteristics described above, utilizing
typical specifications of well-designed oscillators having a 10MHz
nominal frequency:
| Type |
Typical Aging |
Typical shift
for 5ºC |
Allowable
Offset |
Typical
Warm-up |
Allan Variance
(T=1 s) |
|
XO
|
3 x 10-7 per month |
5 x 10-6
|
60 Hz
|
30 minutes
|
1 x 10-9
|
|
TCXO
|
1 x 10-7 per month
|
1 x 10-6
|
13 Hz
|
3 hours
|
1 x 10-10
|
|
OvenXO
|
5 x 10-10 per day
|
5 x 10-10
|
150 mHz
|
3 days
|
5 x 10-12
|
|
Rubidium
|
1 x 10-11 per month
|
5 x 10-12
|
400 µHz
|
4 hours
|
7 x 10-12
|
|
Cesium
|
None
(Primary std.)
|
3 x 10-12
|
6 µHz
|
45 minutes
(21.5 ns/hour)
|
1 x 10-11
|
Table 1 -- Typical specifications
of the 5 types of oscillator
Time Base Warm Up
Under typical operating conditions, that
is, when the instrument's power cord is left connected to the power
source, there is no warm up because the time base is kept "warm"
or in a "standby" mode. However, if the unit has been
disconnected from the power source for 24 hours or more, the instrument
should technically be warmed up for up to 30 days for it to meet
guaranteed specifications. This may not be practical. Our experience
has shown that approximately 85 percent of new units and 95 percent
of older units will be within specifications after three days of
warm up. Of course, this is due to the aging process slowing down
over time. A typical problem you may encounter with some of the
older units is that the time base has aged to a point where the
mechanical adjustment can no longer compensate the frequency drift
because the mechanical adjusting device has reached the physical
limit of its travel. On other older units, drift may be almost non-existent.
The Question
Do you have to calibrate an oven time base
even though the manual for the instrument being calibrated does
not have a performance test for it? The answer is YES. The oven
time base needs to have a drift test performed. The decision to
remove offset depends upon the needs of the customer and the type
of time base being calibrated. Calibration should always be checked
after repair, after being shipped (shock can cause an offset of
1 part in 108, and you don't know in which direction),
or periodically to ensure that measurements made with these devices
are within specifications ACCORDING TO THE USE OF THE INSTRUMENT.
This is an important concept. Many users expect an oven time base
to have a written specification to tell them exactly when the cumulative
offset caused by aging has crossed some specification bound. These
oscillators are just not specified in this manner. The use of the
time base and the measurement needs of the user dictate how the
time base is to be calibrated and supported.
On the other hand, crystal oscillator (clock)
accuracy is seldom of consequence in practical time interval measurements.
Most electronic counters have a quartz oscillator with an accuracy
of 1 part in 106 (1 part per million) or better. As a
result, the effect of oscillator stability does not affect a time
interval measurement unless the display has 5 or 6 valid digits
of information. While it is possible to measure long intervals with
high resolution, most practical measurements today are the rise
time of fast signals, propagation time through high-speed logic,
or on narrow pulses. Resolving a 5µs interval to 1 nanosecond entails
only 4 digits of information - i.e., 5000 nanoseconds - so an oscillator
as poor as 1 part in a million introduces only 1/200th
as much error as ±1 count for this measurement. For shorter intervals
the oscillator error is proportionally less.
Time interval averaging increases the number
of valid digits, but here again usually not to the extent that crystal
accuracy is important. Short-term stability may become important
when doing time-interval averaging on narrow pulses. The short-term
stability specification is statistical in nature so is worse for
short averaging times. Consider for example a short-term accuracy
specification of 1 x 10-9 for a 1 second averaging time.
This would be 1 x 10-3 for a 1µs averaging time (5 nanoseconds
for the example above) and would be greater for an oscillator with
poorer short-term stability.
Aging rate is generally of consequence only
in an application where the counter is used to make phase or time
measurements to compare high precision frequency standards. In this
application a counter is used to measure the time variations between
once-per-second time ticks from the two different frequency standards.
Each time-interval measurement may be as long as 1 second (1 x 106µs)
on frequencies that are stable 5 parts in 1012 or better,
so a stable crystal oscillator is needed.
Accuracy and Stability
Accuracy may be defined as the closeness
of a measurement to the true value as fixed by a universally accepted
standard. The measure of accuracy, however, is in terms of its complementary
notion, that is, deviation from true value, or limit of error, so
that high accuracy has a low deviation and low accuracy a high deviation.
The plots shown in Figure 2 show successive measurements
for four cases. The readings in case 2 are more spread out. This
could be due to noise or the operator's inability to consistently
read an analogue dial. The readings in case 3 are stable but offset
from actual value. The important thing is that this offset is a
systematic error that can be removed by calibration. The random
errors of case 4 cannot be calibrated out.
Figure 2 -- Pictorial
representation of accuracy and stability
Frequency Calibration Interval
In theory, a time system based upon a quartz
oscillator or a rubidium standard of known drift rate can be kept
within prescribed limits of error with infrequent adjustments through
a systematic approach.
With this systematic approach, the oscillator
and clock are preset to offsets that will keep the time system operating
within a selected accuracy for a long time despite the oscillator's
drift. This drift (aging rate) must be known (measured) and must
be nearly constant, so that a plot of the frequency over the adjustment
interval (periods between calibration) can be approximated by a
straight line.
What this means in simple terms is that
the time base is adjustable, and if its drift rate is known, it
can be set so that the drift remains within specifications for longer
period of time, therefore extending the interval between calibrations.
One thing cannot be over-stressed; the limiting
factor for almost all time-bases is your ability to keep the temperature
constant for the duration of the test. This is why the ability to
make measurements and adjustments quickly is so important.
Once you have created a historical rate
of drift (aging) for your particular instrument, you can calibrate
it to an offset to take advantage of the known drift. For example,
if you know that the timebase drifts from low to high at a certain
rate, you can calibrate your unit at the low end of its specification
so that it will drift from low through center and be at the high
end of its specification at a prescribed point in time.
Recalibration Charts for Quartz Oscillators
and Rubidium Standards
Figure 3 is useful for estimating
the length in days of the recalibration cycle for an oscillator
with a known drift rate, which will keep the time system based on
that oscillator within prescribed error limits. A recalibration
cycle is the time, in days, that can be allowed to pass between
calibration adjustments. A shorter cycle (more frequency adjustments)
is needed to keep a system accurate to ±100µs (total time excursion
equals 200µs), rather than to 1ms.
To use the charts, select the slant line
marked for the aging, or drift rate of the oscillator in parts-per-day.
Note the intersection of this line with the horizontal line corresponding
to the permitted error excursion. This intersection, referred down
to the horizontal axis, gives the recalibration cycle.
Example
A time system is to be maintained to within 10ms based on a quartz
oscillator with a positive aging rate at 5x10-10/day.
Use Figure 3 to estimate the length of the recalibration
cycle by locating the slant line marked 5x10-10/day (purple) and note its intersection with the horizontal
line corresponding to a total time excursion of 0.020 seconds (±10ms).
The answer read from the chart is 60 days.
Figure 3 -- Recalibration
chart for quartz oscillators
Temperature Effects
A very small temperature change can drastically
affect the frequency of a time base. In some cases, 1/2°C temperature
change can cause as much drift as 2 weeks of aging. Two points are
worth remembering with respect to temperature effects. First, the
change of frequency with temperature is usually not a linear function;
furthermore, all crystals, even though the same kind, may have very
different frequency temperature curves. Individual oscillator frequency-temperature
curves must be made to determine a particular unit's actual performance.
Second, the effects of temperature change can be reduced by providing
a more constant ambient temperature (controlled room temperature)
when better performance is required.
Line Voltage Change
Crystal oscillator frequency is also influenced
by line voltage changes (often because the instrument's power dissipation
increases, which causes the temperature inside of the instrument
to rise). Good circuit design, proper buffering, and good mechanical
design can reduce these effects. Operators needing better performance
can use a line regulator to better control line voltage fluctuations.
Summary
Each time base ages differently. You should
create a history file for each of your instruments and plot its
drift. Determine how the unit is going to be used. If your measurements
require extreme accuracy, the timebase will have to be calibrated
more often. Either way, when you calibrate the timebase, adjust
it to the extreme end of its specification and let it drift through
center to the other end of its specification, maintaining calibration
for the long period of time.
Keep your instruments plugged into the power
source to maintain constant internal temperatures, and use a line
regulator to buffer line voltage changes.
Above all, think about how you using the
instrument and what is reasonable to expect from it. Do not try
to use your counter to calibrate a cesium beam frequency standard
!
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